Noise Temperature Measurements on Wafer (Classic Reprint)

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Excerpt from Noise Temperature Measurements on WaferParameters on wafer, in particular the noise figure of a two - port device, such as some variety of low-noise transistor. The noise figure of a device is a measure of the noise added to the input signal by the device itself. It is determined by measuring the output noise power from the device for different known levels of input noise power. Because the noise figure of a device depends on the impedance of the input source, it must be measured for several different input impedances to characterize that dependence. Alternatively, if there is a single input impedance of interest, for example, 50 0, then the noise figure can be measured at just that one impedance. A good deal of work.About the PublisherForgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.comThis book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully, any imperfections that remain are intentionally left to preserve the state of such historical works.